PULSED FIELD GEL ELECTROPHORETIC STUDY OF THE REPAIR OF X-RAY-INDUCED DNA DOUBLE-STRAND BREAKS IN YEAST

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dc.contributor.authorAbdullahi, Anderson Kassimu
dc.date.accessioned2014-02-03T15:08:31Z
dc.date.available2014-02-03T15:08:31Z
dc.date.issued1997-11
dc.descriptionA thesis submitted to the Postgraduate School, Ahmadu Bello University, Zaria, in partial fulfillment of the requirements for the award of the degree of Master of Science in Radiation Biophysics. November, 1997en_US
dc.description.abstractDiploid yeast cells Rad 54-3 of strain Saccharomyces Cerevisiae were prepared for survival assay, double-strand break (DSB), repair and budding delay analysis after irradiation with various doses of X rays. The survival results provide indirect evidence for the repair of DNA DSB at the permissive temperature 23°C and inability to do so at the restrictive temperature 36°C. Using the Clamped Homogeneous Electric Field (CHEF) electrophoresis method, the DNA DSB induction frequency was found to be (7.43 ± 0.34) x 10-12 (g/mol)-1 Gy-1. Repair investigation using same method appear to show the occurrence of secondary DSBs and also provided direct evidence for the repair of DSB at 23°C post-irradiation incubation in growth medium and inability to repair the lesions at 36 °C. The secondary DSBs could be due to enzymatic incisions at the damage sites enhanced by incubation in growth medium while the monophasic repair, found to lack the fast repair component, could be due to the relatively low dose used (maximum of 82 Gy). A parallel experiment to the repair investigation - budding delay analysis - showed that budding delay is dependent on irradiation dose and incubation temperatureen_US
dc.identifier.urihttp://hdl.handle.net/123456789/111
dc.language.isoenen_US
dc.subjectPULSED,en_US
dc.subjectFIELD.en_US
dc.subjectGEL,en_US
dc.subjectELECTROPHORETIC,en_US
dc.subjectREPAIR,en_US
dc.subjectX-RAY-INDUCED,en_US
dc.subjectDNA,en_US
dc.subjectDOUBLE-STRAND,en_US
dc.subjectBREAKS,en_US
dc.subjectYEAST.en_US
dc.titlePULSED FIELD GEL ELECTROPHORETIC STUDY OF THE REPAIR OF X-RAY-INDUCED DNA DOUBLE-STRAND BREAKS IN YEASTen_US
dc.typeThesisen_US
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