SPECTRUM STRIPPING ANALYSIS OF THE INHERENT SPECTRAL PERFORMANCES OF CHEMICAL VAPOR DEPOSITION (CVD) DIAMOND DETECTORS EXPOSED TO ALPHA-PARTICLE RADIATION

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dc.contributor.authorABDULLAHI, MUHAMMAD VATSA
dc.date.accessioned2014-02-11T09:54:16Z
dc.date.available2014-02-11T09:54:16Z
dc.date.issued2012-11
dc.descriptionA THESIS REPORT SUBMITTED TO THE POSTGRADUATE SCHOOL, AHMADU BELLO UNIVERSITY, ZARIA, IN PARTIAL FULFILMENT OF THE REQUIREMENT FOR THE AWARD OF MASTERS OF SCIENCE (M.Sc.) IN RADIATION BIOPHYSICS DEPARTMENT OF PHYSICS FACULTY OF SCIENCE AHMADU BELLO UNIVERSITY, ZARIA, NIGERIA OCTOBER, 2012.en_US
dc.description.abstractThe research put forth the outcome of the spectrum stripping analysis used to remove the defects and background noise levels from the experimental alpha spectra of nine Chemical Vapour Deposition (CVD) diamond wafers when used as detectors of α-particles radiation. The spectra, each with different spectral width/peak broadening attributable to the presence of defect/impurity concentration were analyzed for statistical noise and fluctuations. The objective was to provide a spectra resolution necessary for comparative spectrometric analysis to be performed on the detectors under investigation. The detectors average leakage current was measured to be 5.2pA for Single Crystal (SC); 21.5pA for Detector Grades (DG); and 5.2pA for Optical Grades (OG) and its contribution to the noise level analyzed. The poor spectra resolution was reported to be due not only to difference in defects concentration but also to background statistical effect and noise levels. The observed effect of defects and background effects on the experimentally acquired spectrum was analyzed using a High Performance Language MATLAB. An average spectrum peak resolution of 9.5% for DG, 67.4% for OG and 1.7% for SC was calculated. The average absolute efficiency of 0.19% for DG, 0.15% for OG and 0.12% for SC, full energy peak efficiency of 87% for DG and OG, 96% for SC and the particle range from the alpha particle range-energy plot were all analyzed and the results compared. The results show an improvement on the experimental observations without affecting the detectors inherent characteristic performance.en_US
dc.identifier.urihttp://hdl.handle.net/123456789/1095
dc.language.isoenen_US
dc.subjectSPECTRUMen_US
dc.subjectSTRIPPINGen_US
dc.subjectANALYSISen_US
dc.subjectINHERENTen_US
dc.subjectPERFORMANCESen_US
dc.subjectCHEMICALen_US
dc.subjectVAPORen_US
dc.subjectDEPOSITIONen_US
dc.subjectDIAMONDen_US
dc.subjectEXPOSEDen_US
dc.subjectALPHA-PARTICLEen_US
dc.subjectRADIATIONen_US
dc.titleSPECTRUM STRIPPING ANALYSIS OF THE INHERENT SPECTRAL PERFORMANCES OF CHEMICAL VAPOR DEPOSITION (CVD) DIAMOND DETECTORS EXPOSED TO ALPHA-PARTICLE RADIATIONen_US
dc.typeThesisen_US
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